@inproceedings{badola-zhang-2026-image,
title = "Image-Based Representation of Item Response Patterns for Test Integrity",
author = "Badola, Akshay and
Zhang, Mo",
editor = "Wilson, Joshua and
Ormerod, Christopher and
Beiting-Parrish, Magdalen",
booktitle = "Proceedings of the Artificial Intelligence in Measurement and Education Conference ({AIME}-Con): Full Papers",
month = oct,
year = "2026",
address = "Wyndham Grand Pittsburgh Downtown, Pittsburgh, Pennsylvania, United States",
publisher = "National Council on Measurement in Education (NCME)",
url = "https://aclanthology.org/2026.aimecon-main.54/",
pages = "483--489",
ISBN = "979-8-9983004-0-0",
abstract = "This work re-frames anomalous test response detection in standardized testing as binary image classification by transforming test response logs into fixed-size matrix representations and treating them as grayscale images. Deep learning architectures, including ResNet and Vision Transformer, are evaluated. Experiments demonstrate that the approach is feasible and achieves high recall."
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%0 Conference Proceedings
%T Image-Based Representation of Item Response Patterns for Test Integrity
%A Badola, Akshay
%A Zhang, Mo
%Y Wilson, Joshua
%Y Ormerod, Christopher
%Y Beiting-Parrish, Magdalen
%S Proceedings of the Artificial Intelligence in Measurement and Education Conference (AIME-Con): Full Papers
%D 2026
%8 October
%I National Council on Measurement in Education (NCME)
%C Wyndham Grand Pittsburgh Downtown, Pittsburgh, Pennsylvania, United States
%@ 979-8-9983004-0-0
%F badola-zhang-2026-image
%X This work re-frames anomalous test response detection in standardized testing as binary image classification by transforming test response logs into fixed-size matrix representations and treating them as grayscale images. Deep learning architectures, including ResNet and Vision Transformer, are evaluated. Experiments demonstrate that the approach is feasible and achieves high recall.
%U https://aclanthology.org/2026.aimecon-main.54/
%P 483-489
Markdown (Informal)
[Image-Based Representation of Item Response Patterns for Test Integrity](https://aclanthology.org/2026.aimecon-main.54/) (Badola & Zhang, AIME-Con 2026)
ACL
- Akshay Badola and Mo Zhang. 2026. Image-Based Representation of Item Response Patterns for Test Integrity. In Proceedings of the Artificial Intelligence in Measurement and Education Conference (AIME-Con): Full Papers, pages 483–489, Wyndham Grand Pittsburgh Downtown, Pittsburgh, Pennsylvania, United States. National Council on Measurement in Education (NCME).